X-Ray Diffraction (XRD)

The X-Ray Diffraction (XRD) is a technique used to find out the nature of the materials as crystalline or amorphous. It defines the quantification of materials. It analyzes and identifies the unknown crystalline compounds by Brag Brentano method. The different parameters such as scan step size, collection time, range, X-ray tube voltage and current should be fixed based on the specimen's requirement analysis. The standard database (JCPDS database) for XRD pattern is used for phase identification of crystalline phases.